David C Joy

David C Joy is the author of "Scanning Electron Microscopy and X-Ray Microanalysis", "Monte Carlo Modeling for Electron Microscopy and Microanalysis", "Sem Microcharacterization of Semiconductors" and "Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical...

Books by David C Joy

Scanning Electron...

Goldstein, Joseph
Hardback:

Monte Carlo Model...
Joy, David C.
Hardback: $380.00

Sem Microcharacte...
Holt D. B.
Electronic book text: $87.54

Advanced Scanning...
Echlin, Patrick
Paperback: $109.99