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Anomalous X-Ray Scattering for Materials Character... - a book by Waseda, Yoshio

Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

Anomalous X-Ray Scattering for Materials Characterization( )
Author: Waseda, Yoshio
Series title:Springer Tracts in Modern Physics Ser.
ISBN:978-3-662-14637-8
Publication Date:Oct 2013
Publisher:Springer
Book Format:Paperback
List Price:USD $359.00
Book Description:

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component....
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Book Details
Pages:214
Detailed Subjects: Science / Physics / Crystallography
Physical Dimensions (W X L X H):6.045 x 9.165 x 0.191 Inches
Book Weight:0.794 Pounds

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