Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections |
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| Author:
| Tan, Cher Ming
Li, Wei
Gan, Zhenghao
Hou, Yuejin |
| Series title: | Springer Series in Reliability Engineering Ser. |
| ISBN: | 978-1-4471-2641-6 |
| Publication Date: | Apr 2013 |
| Publisher: | Springer London, Limited
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $109.99 |
Book Description:
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This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.