Beam Diagnostics in Superconducting Accelerating Cavities The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes |
|
Author:
| Zhang, Pei |
Series title: | Springer Theses Ser. |
ISBN: | 978-3-319-00758-8 |
Publication Date: | Aug 2013 |
Publisher: | Springer International Publishing AG
|
Imprint: | Springer |
Book Format: | Hardback |
List Price: | USD $109.99 |
Book Description:
|
This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics.
This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics.