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CTL for Test Information of Digital ICs - a book by Kapur, Rohit

CTL for Test Information of Digital ICs

CTL for Test Information of Digital ICs( )
Author: Kapur, Rohit
ISBN:978-1-4757-7800-7
Publication Date:Apr 2013
Publisher:Springer
Book Format:Paperback
List Price:USD $179.00
Book Description:

From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

Book Details
Pages:173
Detailed Subjects: Technology & Engineering / Electronics / Circuits / Integrated
Computers / Software Development & Engineering / Systems Analysis & Design
Physical Dimensions (W X L X H):6.045 x 9.165 x 0.156 Inches
Book Weight:0.651 Pounds

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