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CTL for Test Information of Digital ICs - a book by Kapur, Rohit

CTL for Test Information of Digital ICs

CTL for Test Information of Digital ICs( )
Author: Kapur, Rohit
Publication Date:Apr 2013
Book Format:Paperback
List Price:USD $179.00
Book Description:

CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL. CTL for Test...
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Book Details
Detailed Subjects: Technology & Engineering / Electronics / Circuits / Integrated
Computers / Software Development & Engineering / Systems Analysis & Design
Physical Dimensions (W X L X H):6.045 x 9.165 x 0.156 Inches
Book Weight:0.651 Pounds

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