Cluster Secondary Ion Mass Spectrometry
Principles and Applications
Mahoney, Christine M.
|Series title:||Wiley Series on Mass Spectrometry Ser.|
|Publication Date:||Jul 2013|
| Publisher:||John Wiley & Sons, Incorporated|
| Book Format:||Hardback|
|List Price:||USD $123.00|
| Book Description: |
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.