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Design for at-Speed Test, Diagnosis and Measuremen...

Design for at-Speed Test, Diagnosis and Measurement

Design for at-Speed Test, Diagnosis and Measurement( )
Editor: Nadeau-Dostie, Benoit
Series title:Frontiers in Electronic Testing Ser.
Publication Date:Apr 2013
Book Format:Paperback
List Price:USD $179.00
Book Description:

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test,...
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Book Details
Detailed Subjects: Technology & Engineering / Electrical
Physical Dimensions (W X L X H):6.942 x 9.906 x 0.215 Inches
Book Weight:1.1 Pounds

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