Electrical Overstress (EOS) Devices, Circuits and Systems |
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| Author:
| Voldman, Steven H. |
| ISBN: | 978-1-118-70332-8 |
| Publication Date: | Sep 2013 |
| Publisher: | John Wiley & Sons, Incorporated
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| Book Format: | Digital online |
| List Price: | USD $105.95 |
Book Description:
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Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures.
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures.