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Electrical Overstress (EOS) - a book by Voldman, Steven H.

Electrical Overstress (EOS)

Devices, Circuits and Systems

Electrical Overstress (EOS)( )
Author: Voldman, Steven H.
Publication Date:Aug 2013
Publisher:John Wiley & Sons, Incorporated
Book Format:Ebook
List Price:Contact Supplier contact
Book Description:

Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.  This bookteaches the fundamentals of electrical overstress  and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design.  It provides an illuminating insight into the...
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Book Details
Detailed Subjects: Technology & Engineering / Electronics / Semiconductors
Technology & Engineering / Electrical
Physical Dimensions (W X L X H):5.928 x 8.931 x 0.585 Inches
Book Weight:1.5 Pounds

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