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Helium Ion Microscopy - a book by Joy, David C.

Helium Ion Microscopy

Principles and Applications

Helium Ion Microscopy( )
Author: Joy, David C.
Series title:SpringerBriefs in Materials Ser.
ISBN:978-1-4614-8659-6
Publication Date:Sep 2013
Publisher:Springer
Book Format:Paperback
List Price:USD $54.99
Book Description:

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their...
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