Search Type
  • All
  • Subject
  • Title
  • Author
  • Publisher
  • Series Title
Search Title

Download

Optically Active Charge Traps and Chemical Defects... - a book by van Schooten, Kipp

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance( )
Author: van Schooten, Kipp
Series title:Springer Theses Ser.
ISBN:978-3-319-00589-8
Publication Date:Jul 2013
Publisher:Springer
Book Format:Hardback
List Price:USD $129.00
Book Description:

This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

Book Details
Pages:90
Detailed Subjects: Technology & Engineering / Nanotechnology & Mems
Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):6.045 x 9.165 Inches
Book Weight:0.726 Pounds

Book Seller

Condition

Price

Shipping

Total

Loading Stock Details...


NEW!
Bowker Bookwire™ App

Bookwire is a mobile app for your iPhone that gives you the ability to scan a barcode or enter ISBN, access book records and add titles to wish lists. Android app on Google Play

Featured Books

The Rest of Us Just Live Here
Ness, Patrick
Hardback: $20.85
The Burning Edge
Mofina, Rick
Electronic book text:
When in French
Collins, Lauren
Hardback: $27.00

Rate this title:

Select your rating below then click 'submit'.






I do not wish to rate this title.