Silver Metallization Stability and Reliability |
|
| Author:
| Adams, Daniel
Alford, Terry L.
Mayer, James W. |
| Series title: | Engineering Materials and Processes Ser. |
| ISBN: | 978-1-84800-026-1 |
| Publication Date: | Oct 2007 |
| Publisher: | Springer London, Limited
|
| Imprint: | Springer |
| Book Format: | Hardback |
| List Price: | USD $109.99 |
Book Description:
|
Anyone involved in circuit technology will find this an absolute must-read. It's the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.
Anyone involved in circuit technology will find this an absolute must-read. It's the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.