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Spatial Statistics for Remote Sensing

Spatial Statistics for Remote Sensing( )
Editor: Stein, Alfred
Van der Meer, Freek
Gorte, Ben
Series title:Remote Sensing and Digital Image Processing Ser.
ISBN:978-1-4020-0551-0
Publication Date:Mar 2002
Publisher:Springer Netherlands
Imprint:Springer
Book Format:Paperback
List Price:USD $169.99
Book Description:

This book is a collection of papers on spatial statistics for remote sensing. The book emerges from a study day that was organized in 1996 at the International Institute for Aerospace Survey and Earth Sciences, ITC, in Enschede, The Netherlands. It was by several means a memorable event. The beautiful new building, according to a design by the famous modern Dutch architect Max van Huet was just opened, and this workshop was the first to take place there. Of course, much went wrong...
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Book Details
Pages:284
Detailed Subjects: Technology & Engineering / Remote Sensing & Geographic Information Systems
Physical Dimensions (W X L X H):6.045 x 9.165 Inches
Book Weight:1.203 Pounds



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