Transmission Electron Microscopy and Diffractometry of Materials |
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| Author:
| Fultz, Brent
Howe, James |
| Series title: | Graduate Texts in Physics Ser. |
| ISBN: | 978-3-642-29761-8 |
| Publication Date: | Oct 2012 |
| Publisher: | Springer Berlin / Heidelberg
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| Imprint: | Springer |
| Book Format: | Ebook |
| List Price: | USD $129.00 |
Book Description:
|
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.