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1.
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2.
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-
ISBN:
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978-1-4419-6992-7
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Book Format:
- Hardback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Sep 2010
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3.
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Test, Defect Tolerance, and Reliability
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ISBN:
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978-0-387-74746-0
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Book Format:
- Hardback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Dec 2007
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4.
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A Guide to the IEEE 1149.4 Test Standard
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ISBN:
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978-0-7923-8686-5
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Book Format:
- Hardback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Oct 1999
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5.
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-
ISBN:
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978-1-4614-2689-9
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Book Format:
- Paperback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Nov 2012
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6.
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Simulation and Applications
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7.
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8.
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ISBN:
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978-1-4613-7535-7
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Book Format:
- Paperback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Oct 2012
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9.
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10.
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-
ISBN:
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978-1-4419-5391-9
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Book Format:
- Paperback
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List Price:
- AUD $311.95
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Publisher:
- Springer
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Publication Date:
- Jul 2010
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11.
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The Macro Test Approach
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12.
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A Guide to the IEEE 1149. 4 Test Standard
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ISBN:
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978-1-4757-4499-6
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Book Format:
- Ebook
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List Price:
- USD $259.00
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Publisher:
- Springer
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Publication Date:
- Mar 2013
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13.
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Rationale and Application of IEEE Std. 1500(tm)
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14.
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15.
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Defects, Fault Models and Test Patterns
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16.
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Challenges and Methodologies
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ISBN:
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978-1-4899-8773-0
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Book Format:
- Paperback
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List Price:
- USD $169.99
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Publisher:
- Springer
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Publication Date:
- Dec 2014
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17.
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18.
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Rationale and Application of IEEE Std. 1500
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19.
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Simulation and Applications
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20.
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