Guido Groeseneken

Guido Groeseneken is the author of "Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications", "Bias-Temperature-Instabilities in Mosfets with High-K Dielectrics", "Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications" and...

Books by Guido Groeseneken

Reliability of Hi...
Franco, Jacopo
Hardback: $109.99

Reliability of Hi...
Franco, Jacopo
Electronic book text: $129.00

Esd Protection Ch...
Thijs, Steven
Paperback: $109.00

Reliability of Hi...
Franco, Jacopo
Paperback: $109.99