Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections |
|
Author:
| Tan, Cher Ming Li, Wei Gan, Zhenghao Hou, Yuejin |
Series title: | Springer Series in Reliability Engineering Ser. |
ISBN: | 978-1-4471-2641-6 |
Publication Date: | Apr 2013 |
Publisher: | Springer
|
Book Format: | Paperback |
List Price: | AUD $249.95 |
Book Description:
|
This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.