Cluster Secondary Ion Mass Spectrometry Principles and Applications |
|
| Author:
| Mahoney, Christine M. |
| Series title: | Wiley Series on Mass Spectrometry Ser. |
| ISBN: | 978-0-470-88605-2 |
| Publication Date: | Jul 2013 |
| Publisher: | John Wiley & Sons, Incorporated
|
| Book Format: | Hardback |
| List Price: | USD $137.95 |
Book Description:
|
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.