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Electrothermal Analysis of VLSI Systems

Electrothermal Analysis of VLSI Systems( )
Author: Yi-Kan Cheng, Yi-Kan
Ching-Han Tsai, Ching-Han
Chin-Chi Teng, Chin-Chi
Sung-Mo (Steve) Kang, Sung-Mo (Steve)
ISBN:978-1-4757-7373-6
Publication Date:Apr 2013
Publisher:Springer
Book Format:Paperback
List Price:USD $179.00
Book Description:

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

Book Details
Pages:210
Detailed Subjects: Technology & Engineering / Electronics / Semiconductors
Science / General
Technology & Engineering / Electronics / Circuits / Vlsi & Ulsi
Physical Dimensions (W X L X H):6.045 x 9.165 x 0.199 Inches
Book Weight:0.821 Pounds

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