Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications
|Series title:||Springer Series in Advanced Microelectronics Ser.|
|Publication Date:||Oct 2013|
| Book Format:||Hardback|
|List Price:||USD $129.00|
| Book Description: |
This book explores the reliability of novel (Si)Ge channel quantum well pMOSFET technology. It proposes a physical model to understand the intrinsically superior reliability of the MOS system consisting of a Ge-based channel and a SiO2/HfO2 dielectric stack.