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Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications

Reliability of High Mobility Sige Channel MOSFETs for Future CMOS Applications( )
Author: Franco, Jacopo
Kaczer, Ben
Groeseneken, Guido
Series title:Springer Series in Advanced Microelectronics Ser.
ISBN:978-94-007-7662-3
Publication Date:Oct 2013
Publisher:Springer
Book Format:Hardback
List Price:USD $129.99
Book Description:

This book explores the reliability of novel (Si)Ge channel quantum well pMOSFET technology. It proposes a physical model to understand the intrinsically superior reliability of the MOS system consisting of a Ge-based channel and a SiO2/HfO2 dielectric stack.

Book Details
Pages:187
Detailed Subjects: Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):6.045 x 9.165 x 0.195 Inches
Book Weight:1.054 Pounds

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