Semiconductor Memories Technology, Testing, and Reliability |
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| Author:
| Sharma, Ashok K. |
| ISBN: | 978-0-7803-1000-1 |
| Publication Date: | Sep 2002 |
| Publisher: | John Wiley & Sons, Incorporated
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| Imprint: | Wiley-IEEE Press |
| Book Format: | Hardback |
| List Price: | USD $239.95 |
Book Description:
|
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
∗ Memory cell structures and fabrication technologies.
∗ Application-specific memories and architectures.
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
∗ Memory cell structures and fabrication technologies.
∗ Application-specific memories and architectures.