Three-Dimensional X-Ray Diffraction Microscopy Mapping Polycrystals and Their Dynamics |
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| Author:
| Poulsen, Henning Friis |
| Series title: | Springer Tracts in Modern Physics Ser. |
| ISBN: | 978-3-662-14543-2 |
| Publication Date: | Oct 2013 |
| Publisher: | Springer Berlin / Heidelberg
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $219.99 |
Book Description:
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Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book...
More Description
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.