| 1998 IEEE International Integrated Reliability Workshop Final Report Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 | | | Contribution by:
| International Integrated Reliability Workshop,
IEEE, Electron Devices Society Staff,
IEEE, Reliability Society Staff, | | ISBN: | 978-0-7803-4882-0 | | Publication Date: | Jan 1999 | | Publisher: | IEEE
| | Book Format: | Hardback | | List Price: | Contact Supplier contact
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