Characterization of High Tc Materials and Devices by Electron Microscopy |
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| Editor:
| Browning, Nigel D.
Pennycook, Stephen J. |
| ISBN: | 978-0-521-03170-7 |
| Publication Date: | Nov 2006 |
| Publisher: | Cambridge University Press
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| Book Format: | Paperback |
| List Price: | USD $43.99 |
Book Description:
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A clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This text is an indispensable reference for graduate students and researchers in materials science and engineering,...
More DescriptionA clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This text is an indispensable reference for graduate students and researchers in materials science and engineering, and physics.