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Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy( )
Editor: Browning, Nigel D.
Pennycook, Stephen J.
ISBN:978-1-280-41701-6
Publication Date:Jan 2000
Publisher:Cambridge University Press
Book Format:Ebook
List Price:USD $150.00
Book Description:

This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a...
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Book Details
Pages:407



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