Emerging Nanotechnologies Test, Defect Tolerance, and Reliability |
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| Editor:
| Tehranipoor, Mohammad |
| Series title: | Frontiers in Electronic Testing Ser. |
| ISBN: | 978-0-387-74746-0 |
| Publication Date: | Dec 2007 |
| Publisher: | Springer
|
| Book Format: | Hardback |
| List Price: | USD $169.99 |
Book Description:
|
An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field.
An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field.