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Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Lock-in Thermography
(
)
Author:
Breitenstein, Otwin
Warta, Wilhelm
Langenkamp, Martin
Series title:
Springer Series in Advanced Microelectronics Ser.
ISBN:
978-3-642-07785-2
Publication Date:
Mar 2011
Publisher:
Springer
Book Format:
Paperback
List Price:
USD $169.00
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Book Details
Pages:
193
Detailed Subjects:
Technology & Engineering / Electronics / General
Technology & Engineering / Electronics / Semiconductors
Technology & Engineering / Remote Sensing & Geographic Information Systems
Physical Dimensions
(W X L X H)
:
6.045 x 9.165 Inches
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