Scan Statistics Methods and Applications |
|
| Editor:
| Glaz, Joseph
Pozdnyakov, Vladimir
Wallenstein, Sylvan |
| Series title: | Statistics for Industry and Technology Ser. |
| ISBN: | 978-0-8176-4748-3 |
| Publication Date: | May 2009 |
| Publisher: | Birkhäuser Boston
|
| Imprint: | Birkhäuser |
| Book Format: | Hardback |
| List Price: | USD $169.99 |
Book Description:
|
Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.
Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.