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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy( )
Author: Lyman, Charles E.
Armstrong, John
Echlin, Patrick
Fiori, Charles
Goldstein, Joseph
Joy, David C.
Lifshin, Eric
Romig, Alton D.
Williams, David B.
Peters, Klaus-Rüdiger
ISBN:978-0-306-43591-1
Publication Date:Aug 1990
Publisher:Springer
Book Format:Paperback
List Price:USD $109.99
Book Description:

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the...
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Book Details
Pages:407
Detailed Subjects: Science / Physics / Optics & Light
Science / Electron Microscopes & Microscopy
Physical Dimensions (W X L X H):6.63 x 9.516 Inches
Book Weight:1.615 Pounds



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