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Scanning Probe Microscopy and Spectroscopy

Theory, Techniques, and Applications

Scanning Probe Microscopy and Spectroscopy( )
Editor: Bonnell, Dawn
ISBN:978-0-471-24824-8
Publication Date:Dec 2000
Publisher:John Wiley & Sons, Incorporated
Imprint:Wiley-VCH
Book Format:Hardback
List Price:USD $312.95
Book Description:

Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.

Book Details
Pages:512
Detailed Subjects: Science / Spectroscopy & Spectrum Analysis
Science / Electron Microscopes & Microscopy
Physical Dimensions (W X L X H):6.396 x 9.282 x 1.232 Inches
Book Weight:1.83 Pounds



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