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Displaying 1- 20 of 142
1 2 3 4 5

Author:
Larsson, Erik
ISBN:
978-1-4020-3207-3
Book Format:
Hardback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Nov 2005

ISBN:
978-1-4419-6992-7
Book Format:
Hardback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Sep 2010

Test, Defect Tolerance, and Reliability
ISBN:
978-0-387-74746-0
Book Format:
Hardback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Dec 2007

A Guide to the IEEE 1149.4 Test Standard
ISBN:
978-0-7923-8686-5
Book Format:
Hardback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Oct 1999

ISBN:
978-1-4614-2689-9
Book Format:
Paperback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Nov 2012

Simulation and Applications
Author:
Khare, Jitendra B.
Maly, Wojciech
ISBN:
978-0-7923-9714-4
Book Format:
Hardback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Apr 1996

Author:
Kabisatpathy, Prithviraj
Barua, Alok
Sinha, Satyabroto
ISBN:
978-1-4419-3828-2
Book Format:
Paperback
List Price:
AUD $269.95
Publisher:
Springer
Publication Date:
May 2011

ISBN:
978-1-4613-7535-7
Book Format:
Paperback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Oct 2012

Author:
Iyengar, Vikram
Chandra, Anshuman
ISBN:
978-1-4615-1113-7
Book Format:
Ebook
List Price:
USD $179.00
Publisher:
Springer
Publication Date:
Dec 2012

ISBN:
978-1-4419-5391-9
Book Format:
Paperback
List Price:
AUD $311.95
Publisher:
Springer
Publication Date:
Jul 2010

The Macro Test Approach
Author:
Beenker, F. P. M.
Bennetts, R. G.
Thijssen, A. P.
ISBN:
978-1-4615-2365-9
Book Format:
Ebook
List Price:
USD $289.00
Publisher:
Springer
Publication Date:
Dec 2012

A Guide to the IEEE 1149. 4 Test Standard
ISBN:
978-1-4757-4499-6
Book Format:
Ebook
List Price:
USD $259.00
Publisher:
Springer
Publication Date:
Mar 2013

Rationale and Application of IEEE Std. 1500(tm)
Author:
da Silva, Francisco
McLaurin, Teresa
Waayers, Tom
ISBN:
978-1-4899-8769-3
Book Format:
Paperback
List Price:
AUD $332.95
Publisher:
Springer
Publication Date:
Oct 2014

Author:
Sachdev, Manoj
ISBN:
978-1-280-93821-4
Book Format:
Ebook
List Price:
USD $318.00
Publisher:
Springer
Publication Date:
Jan 2010

Defects, Fault Models and Test Patterns
Author:
Hamdioui, Said
ISBN:
978-1-4020-7752-4
Book Format:
Hardback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Mar 2004

Challenges and Methodologies
ISBN:
978-1-4899-8773-0
Book Format:
Paperback
List Price:
USD $169.99
Publisher:
Springer
Publication Date:
Dec 2014

Author:
Iyengar, Vikram
Chandra, Anshuman
ISBN:
978-1-4613-5400-0
Book Format:
Paperback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Nov 2012

Rationale and Application of IEEE Std. 1500™
Author:
McLaurin, Teresa
Waayers, Tom
Da Silva, Francisco
ISBN:
978-0-387-30751-0
Book Format:
Hardback
List Price:
AUD $332.95
Publisher:
Springer
Publication Date:
Jan 2006

Simulation and Applications
Author:
Khare, Jitendra B.
Maly, Wojciech
ISBN:
978-1-4612-8595-3
Book Format:
Paperback
List Price:
USD $109.99
Publisher:
Springer
Publication Date:
Sep 2011

Author:
Goessel, Michael
Ocheretny, Vitaly
Sogomonyan, Egor
Marienfeld, Daniel
ISBN:
978-1-281-39796-6
Book Format:
Ebook
List Price:
USD $358.00
Publisher:
Springer
Publication Date:
Mar 2009
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