D Keith Bowen

D Keith Bowen is the author of "X-Ray Metrology in Semiconductor Manufacturing", "High Resolution X-Ray Diffractometry and Topography" and "Characterization of Crystal Growth Defects by X-Ray Methods".

Books by D Keith Bowen

X-Ray Metrology i...
Bowen, D. Keith
Electronic book text: $220.00

X-Ray Metrology i...
Bowen, D. Keith
Digital (delivered electronically): $220.00

High Resolution X...
Bowen, D. Keith
Paperback: $74.95

X-Ray Metrology i...
Tanner, Brian K.
Hardback: $225.00