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Manoj Sachdev
Manoj Sachdev is the author of "Thermal and Power Management of Integrated Circuits", "Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits", "Defect Oriented Testing for CMOS Analog and Digital Circuits" and "ESD Protection Device and Circuit Design for Advanced...
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Books by Manoj Sachdev
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Defect Oriented T...
Sachdev, Manoj
Electronic book text:
$99.00
Thermal and Power...
Vassighi, Arman
Hardback:
$109.99
Thermal and Power...
Vassighi, Arman
Electronic book text:
$179.00
CMOS Sram Circuit...
Pavlov, Andrei
Electronic book text:
$358.00