Wojciech Maly

Wojciech Maly is the author of "From Contamination to Defects, Faults and Yield Loss", "Vlsi Design for Manufacturing", "VLSI Design for Manufacturing: Yield Enhancement" and "Atlas of IC Technologies".

Books by Wojciech Maly

VLSI Design for M...
Director, Stephen W.
Paperback: $169.99

From Contaminatio...
Khare, Jitendra B.
Hardback: $109.99

From Contaminatio...
Khare, Jitendra B.
Electronic book text: $179.00

Atlas of IC Techn...
Maly, Wojciech
Paperback: