Applied Scanning Probe Methods XII Characterization |
|
| Editor:
| Bhushan, Bharat
Fuchs, Harald |
| Series title: | NanoScience and Technology Ser. |
| ISBN: | 978-3-642-09870-3 |
| Publication Date: | Nov 2010 |
| Publisher: | Springer
|
| Book Format: | Paperback |
| List Price: | AUD $371.95 |
Book Description:
|
This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications.
This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications.