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Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy( )
Editor: Browning, Nigel D.
Pennycook, Stephen J.
ISBN:978-0-511-53482-9
Publication Date:Aug 2009
Publisher:Cambridge University Press
Book Format:Digital download and online
List Price:AUD $200.00
Book Description:

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.




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