Design and Test Technology for Dependable Systems-On-Chip |
|
| Editor:
| Ubar, Raimund |
| Series title: | Advances in Computer and Electrical Engineering Ser. |
| ISBN: | 978-1-60960-212-3 |
| Publication Date: | Dec 2010 |
| Publisher: | IGI Global
|
| Book Format: | Hardback |
| List Price: | AUD $384.95AUD $254.00 |
Book Description:
|
Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined ""classical"" design and test topics and solutions for IC test technology and fault-tolerant systems.
Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined ""classical"" design and test topics and solutions for IC test technology and fault-tolerant systems.