Design and Test Technology for Dependable Systems-on-Chip |
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Author:
| Ubar, Raimund Raik, Jaan Vierhaus, Heinrich Theodor |
ISBN: | 978-1-60960-214-7 |
Publication Date: | Dec 2010 |
Publisher: | IGI Global
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Book Format: | Ebook |
List Price: | Contact Supplier contact
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Book Description:
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Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.
Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.