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Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Elastic and Inelastic Scattering in Electron Diffraction and Imaging( )
Author: Zhong-lin Wang, Zhong-lin
ISBN:978-1-4899-1581-8
Publication Date:Nov 2013
Publisher:Springer
Book Format:Paperback
List Price:AUD $456.95
Book Description:

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros­ copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials...
More Description

Book Details
Pages:448
Detailed Subjects: Science / Physics / Nuclear
Technology & Engineering / Imaging Systems
Science / Electron Microscopes & Microscopy
Physical Dimensions (W X L X H):15.5 x 23.5 x 0.97 cm
Book Weight:0.73 Kilograms



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