Electrically Based Microstructural Characterization II Vol. 500Materials Research Society Symposium Proceedings |
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| Editor:
| Alim, Mohammed A.
Taylor, S. Ray
Gerhardt, Rosario A. |
| Series title: | MRS Proceedings Ser. |
| ISBN: | 978-1-55899-405-8 |
| Publication Date: | Nov 1998 |
| Publisher: | Cambridge University Press
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| Book Format: | Hardback |
| List Price: | AUD $54.95 |
Book Description:
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This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their materials. Microstructure in this context includes features at all length scales - atomic to macroscopic. Even though numerous examples of microstructure/electrical property correlations exist, this book focuses on the myriad of applications that have already been successful.
This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their materials. Microstructure in this context includes features at all length scales - atomic to macroscopic. Even though numerous examples of microstructure/electrical property correlations exist, this book focuses on the myriad of applications that have already been successful.