In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

(

)

Author:

Editor:

Weiland, Larg H.

ISBN:

978-0-8194-3223-0

Publication Date:

Apr 1999

Publisher:

SPIE

Book Format:

Undefined

List Price:

AUD $150.70

Book Details

Pages:	352
Detailed Subjects:	Technology & Engineering / Electronics / Microelectronics

Without a Map
Hall, Meredith
Paperback: $17.95

The Black Box
Connelly, Michael
Paperback: $12.00

Legacy
Blackstock, Uché
Hardback: $28.00

Rate this title:

Select your rating below then click 'submit'.