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Low Substrate Temperature Modeling Outlook of Scaled N-MOSFET

Low Substrate Temperature Modeling Outlook of Scaled N-MOSFET( )
Author: Ashraf, Nabil Shovon
Iniewski, Kris
Series title:Synthesis Lectures on Emerging Engineering Technologies Ser.
ISBN:978-1-68173-387-6
Publication Date:Jul 2018
Publisher:Morgan & Claypool Publishers
Book Format:Hardback
List Price:AUD $85.00
Book Description:

Explores device parameters such as channel inversion carrier mobility and its characteristic evolution. This book is the first to illustrate that a single subthreshold slope value is erroneous and at lower gate voltage below inversion, subthreshold slope value exhibits a variation tendency on applied gate voltage below threshold.

Book Details
Pages:89
Detailed Subjects: Technology & Engineering / Engineering (General)
Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):19.05 x 23.495 x 0.635 cm
Book Weight:0.377 Kilograms



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