Nonlinear Transistor Model Parameter Extraction Techniques |
|
| Editor:
| Rudolph, Matthias
Fager, Christian
Root, David E. |
| Series title: | The Cambridge RF and Microwave Engineering Ser. |
| ISBN: | 978-0-521-76210-6 |
| Publication Date: | Oct 2011 |
| Publisher: | Cambridge University Press
|
| Book Format: | Hardback |
| List Price: | AUD $199.95 |
Book Description:
|
Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects.
Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects.