Particle-Induced X-Ray Emission Spectrometry (PIXE) |
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Editor:
| Johansson, Sven A. E. Campbell, John L. Malmqvist, Klas G. |
Series edited by:
| Winefordner, James D. |
Series title: | Chemical Analysis: a Series of Monographs on Analytical Chemistry and Its Applications Ser. |
ISBN: | 978-0-471-58944-0 |
Publication Date: | Aug 1995 |
Publisher: | John Wiley & Sons, Incorporated
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Imprint: | Wiley-Interscience |
Book Format: | Hardback |
List Price: | AUD $451.95 |
Book Description:
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The authoritative handbook to exploiting the full power and versatility of PIXE now and in the next century
Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory.
The authoritative handbook to exploiting the full power and versatility of PIXE now and in the next century
Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory.