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Physical Measurement and Analysis of Thin Films
Physical Measurement and Analysis of Thin Films
(
)
Editor:
Murt, E. M.
Guldner, W. G.
ISBN:
978-0-306-39302-0
Publication Date:
Jan 1969
Publisher:
Springer
Book Format:
Hardback
List Price:
AUD $182.95
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Book Details
Pages:
194
Detailed Subjects:
Science / Chemistry / Analytic
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