RF and Microwave Circuits, Measurements, and Modeling |
|
| Editor:
| Golio, Mike
Golio, Janet |
| Contribution by:
| Steer, Michael
Dunleavy, Lawrence P.
Nelson, Charles
Newgard, Robert
Ham, Ronald E.
Curtice, Walter R.
Parker, Anthony
Kenney, J. Stevenson
Fay, Patrick
Cowles, John C.
Kielmeyer, Ron
Lanteri, J-P
Rathmell, James Grantley
Scott, Jonathan B.
Jones, Christopher
Mahon, John R.
Tentzeris, M.
Irvine, Brent
Hale, Paul D.
Remley, Kate A.
Radomski, Aaron
Heckleman, Todd
Teeter, Douglas A.
Spears, Edward T.
Gering, Joseph M.
Nielsen, Troels
Harris, H. Mike
Riddle, Alfy
Kucera, Jakub
Blakey, Peter
Lott, Urs
Sevic, John F.
Swanson, Daniel G.
Trew, Robert
Wendler, P, John |
| Series title: | The RF and Microwave Handbook, Second Edition Ser. |
| ISBN: | 978-0-8493-7218-6 |
| Publication Date: | Dec 2007 |
| Publisher: | CRC Press LLC
|
| Book Format: | Hardback |
| List Price: | AUD $197.99 |
Book Description:
|
Part of the second edition of the best-selling RF and Microwave Handbook, this convenient and sharply focused guide focuses on RF and microwave circuits, measurements, CAD, simulation, and modeling. The growth of wireless technology over the past decade has been enormous, and this carefully edited book discusses the latest developments and technologies impacting the wireless field. New chapters discuss high-power PAs (power amplifiers), bit error rate testing, and nonlinear...
More Description
Part of the second edition of the best-selling RF and Microwave Handbook, this convenient and sharply focused guide focuses on RF and microwave circuits, measurements, CAD, simulation, and modeling. The growth of wireless technology over the past decade has been enormous, and this carefully edited book discusses the latest developments and technologies impacting the wireless field. New chapters discuss high-power PAs (power amplifiers), bit error rate testing, and nonlinear modeling of heterojunction bipolar transistors (HBTs), while most other chapters feature new and updated material that reflects recent progress in such areas as high-volume testing, transmitters and receivers, and CAD tools.