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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies( )
Author: Strong, Alvin W.
Wu, Ernest Y.
Vollertsen, Rolf-Peter
Sune, Jordi
La Rosa, Giuseppe
Sullivan, Timothy D.
Rauch, Stewart E.
Series title:IEEE Press Series on Microelectronic Systems Ser.
ISBN:978-0-471-73172-6
Publication Date:Aug 2009
Publisher:John Wiley & Sons, Incorporated
Imprint:Wiley-IEEE Computer Society Press
Book Format:Hardback
List Price:AUD $351.95
Book Description:

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Book Details
Pages:640
Detailed Subjects: Technology & Engineering / Systems Engineering
Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):16.38 x 24.26 x 3.43 cm
Book Weight:0.995 Kilograms



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