Statistical Methods for SPC and TQM |
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Author:
| Bissell, D. |
Series title: | Chapman and Hall/CRC Texts in Statistical Science Ser. |
ISBN: | 978-0-412-39440-9 |
Publication Date: | May 1994 |
Publisher: | CRC Press LLC
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Imprint: | Chapman & Hall/CRC |
Book Format: | Hardback |
List Price: | AUD $263.99 |
Book Description:
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Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions...
More DescriptionStatistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.
Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices