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Theoretical Concepts of X-Ray Nanoscale Analysis

Theory, Experiments and Applications

Theoretical Concepts of X-Ray Nanoscale Analysis( )
Author: Benediktovitch, Andrei
Feranchuk, Ilya D.
Ulyanenkov, Alexander
Series title:Springer Series in Materials Science Ser.
ISBN:978-3-642-38176-8
Publication Date:Sep 2013
Publisher:Springer
Book Format:Hardback
List Price:AUD $290.95
Book Description:

This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

Book Details
Pages:318
Detailed Subjects: Technology & Engineering / Nanotechnology & Mems
Technology & Engineering / Materials Science / Thin Films, Surfaces & Interfaces
Physical Dimensions (W X L X H):15.5 x 23.5 cm
Book Weight:0.664 Kilograms



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