Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications |
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Author:
| Benediktovitch, Andrei Feranchuk, Ilya Ulyanenkov, Alexander |
Series title: | Springer Series in Materials Science Ser. |
ISBN: | 978-3-662-52054-3 |
Publication Date: | Aug 2016 |
Publisher: | Springer
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Book Format: | Paperback |
List Price: | AUD $249.95 |
Book Description:
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This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.
This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.